Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10180486 | Test standards and methods for impedance calibration of a probe system, and probe systems that include the test standards or utilize the methods | Daniel Bock, Samantha Nhim | 2019-01-15 |
| 7449899 | Probe for high frequency signals | Richard Campbell, Michael Andrews | 2008-11-11 |