Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10393796 | Testing integrated circuits during split fabrication | Lawrence Pileggi, Kaushik Vaidyanathan | 2019-08-27 |
| 8224604 | Gate delay measurement circuit and method of determining a delay of a logic gate | Bharadwaj Amrutur | 2012-07-17 |