Issued Patents All Time
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10061192 | Method and apparatus for correcting errors on a wafer processed by a photolithographic mask | Dirk Beyer, Vladimir Dmitriev, Nadav Wertsman | 2018-08-28 |
| 9436080 | Method and apparatus for correcting errors on a wafer processed by a photolithographic mask | Dirk Beyer, Vladimir Dmitriev, Nadav Wertsman | 2016-09-06 |
| 9207530 | Analyses of measurement data | Vladimir Dmitriev, Erez Graitzer, Igor Varvaruk, Guy Ben-Zvi | 2015-12-08 |
| 9134112 | Critical dimension uniformity correction by scanner signature control | Vladimir Dmitriev, Eran Chason, Guy Ben-Zvi, Igor Varvaruk | 2015-09-15 |
| 8869076 | Global landmark method for critical dimension uniformity reconstruction | Vladimir Dmitriev | 2014-10-21 |
| 8592770 | Method and apparatus for DUV transmission mapping | Guy Ben-Zvi, Eitan Zait, Vladimir Dmitriev, Steven Labovitz, Erez Graitzer | 2013-11-26 |