Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10061192 | Method and apparatus for correcting errors on a wafer processed by a photolithographic mask | Dirk Beyer, Vladimir Dmitriev, Ofir Sharoni | 2018-08-28 |
| 9436080 | Method and apparatus for correcting errors on a wafer processed by a photolithographic mask | Dirk Beyer, Vladimir Dmitriev, Ofir Sharoni | 2016-09-06 |
| 8836780 | Process control and manufacturing method for fan out wafers | Tommy Weiss, Nevo Laron, Thomas Molders, Aki Shoukrun | 2014-09-16 |
| 7317523 | Method for calibrating a metrology tool and a system | Ovadya Menadeva | 2008-01-08 |