Issued Patents All Time
Showing 1–9 of 9 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11276547 | Charged particle optical apparatus for through-the-lens detection of particles | Erik Essers, Michael Albiez, Stefan Meyer, Daniel Kirsten | 2022-03-15 |
| 10861670 | Charged particle optical apparatus for through-the-lens detection of particles | Erik Essers, Michael Albiez, Stefan Meyer, Daniel Kirsten | 2020-12-08 |
| 10522321 | Charged particle optical apparatus for through-the-lens detection of particles | Erik Essers, Michael Albiez, Stefan Meyer, Daniel Kirsten | 2019-12-31 |
| 10068744 | Charged particle optical apparatus for through-the lens detection of particles | Erik Essers, Michael Albiez, Stefan Meyer, Daniel Kirsten | 2018-09-04 |
| 9741528 | Charged particle optical apparatus having a selectively positionable differential pressure module | Michael Albiez, Stefan Meyer, Daniel Kirsten, Erik Essers | 2017-08-22 |
| 9159532 | Method of analyzing a sample and charged particle beam device for analyzing a sample | Edward A. Hill | 2015-10-13 |
| 8859992 | Charged particle beam devices | — | 2014-10-14 |
| 8648301 | Particle beam system having a hollow light guide | Michael Astley | 2014-02-11 |
| 8426812 | Microscope system, method for operating a charged-particle microscope | Roger Rowland, Simon Hees | 2013-04-23 |