Issued Patents All Time
Showing 1–25 of 30 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8309176 | Manufacturing method of three-dimensional structure | Taisuke Isano, Kosuke Asano | 2012-11-13 |
| 8305683 | Polarizer | Kosuke Asano, Taisuke Isano | 2012-11-06 |
| 7375820 | Interference measuring apparatus for detecting a plurality of stable phase difference signals | Ko Ishizuka, Hidejiro Kadowaki, Shigeki Kato, Takayuki Kadoshima, Sakae Horyu | 2008-05-20 |
| 7034947 | Compact interference measuring apparatus for detecting the magnitude and direction of positional deviation | Ko Ishizuka, Hidejiro Kadowaki, Shigeki Kato, Takayuki Kadoshima, Sakae Horyu | 2006-04-25 |
| 6900939 | Polarization insensitive beam splitting grating and apparatus using it | Hikaru Hoshi | 2005-05-31 |
| 6674066 | Encoder | Hidejiro Kadowaki, Ko Ishizuka, Shigeki Kato, Takayuki Kadoshima, Sakae Horyu | 2004-01-06 |
| 6657181 | Optical element used in compact interference measuring apparatus detecting plurality of phase difference signals | Ko Ishizuka, Hidejiro Kadowaki, Shigeki Kato, Takayuki Kadoshima, Sakae Horyu | 2003-12-02 |
| 6618218 | Displacement detecting apparatus and information recording apparatus | Hidejiro Kadowaki, Ko Ishizuka, Shigeki Kato, Takayuki Kadoshima, Sakae Horyu | 2003-09-09 |
| 6473184 | Interferometer which divides light beams into a plurality of beams with different optical paths | Ko Ishizuka, Hidejiro Kadowaki, Shigeki Kato, Takayuki Kadoshima, Sakae Horyu | 2002-10-29 |
| 6259531 | Displacement information measuring apparatus with hyperbolic diffraction grating | Makoto Takamiya, Hidejiro Kadowaki, Kou Ishizuka | 2001-07-10 |
| 6227702 | Method and apparatus for measuring a temperature of a molten metal | Takeo Yamada, Hiroaki Miyahara | 2001-05-08 |
| 6004031 | Temperature measuring device | Takamitsu TAKAYAMA, Zenkichi Yamanaka, Yoshiro Yamada | 1999-12-21 |
| 5880839 | Optical displacement measuring apparatus including a light-emitting element and an adjacent ball lens | Kou Ishizuka | 1999-03-09 |
| 5760392 | Scale for use with a displacement sensor | Kenji Hisamoto | 1998-06-02 |
| 5742391 | Optical type sensor for use as an optical measuring head or optical pickup | Kou Ishizuka, Kenji Hisamoto | 1998-04-21 |
| 5733043 | Temperature measuring device | Takeo Yamada, Yasunori Yoshie, Hiroaki Miyahara, Masayuki Nakada | 1998-03-31 |
| 5680211 | Apparatus for optically detecting displacement of an object using a synthesizing means utilizing a substrate with two diffraction gratings thereon | Koh Ishizuka, Hiroshi Kondo, Satoshi Ishii | 1997-10-21 |
| 5666196 | Optical detection apparatus for detecting information relating to relative displacement of an object on whch a diffraction grating is formed | Satoshi Ishii, Ko Ishizuka, Hiroshi Kondo | 1997-09-09 |
| 5661296 | Rotary encoder measuring substantially coinciding phases of interference light components | Koh Ishizuka | 1997-08-26 |
| 5657125 | Apparatus including a light-detecting element having a photo-electric conversion surface and an integral light blocking member | Shigeki Kato, Koh Ishizuka, Hiroshi Kondo, Satoshi Ishii | 1997-08-12 |
| 5621527 | Apparatus for measuring relative displacement between the apparatus and a scale which a grating is formed | Koh Ishizuka | 1997-04-15 |
| 5574559 | Displacement detection apparatus using multiple displacement detection signals formed by a multiple phase combination grating | Koh Ishizuka, Hiroshi Kondo, Satoshi Ishii | 1996-11-12 |
| 5569913 | Optical displacement sensor | Koh Ishizuka | 1996-10-29 |
| 5557396 | Velocity information detecting apparatus | Koh Ishizuka, Satoshi Ishii | 1996-09-17 |
| 5537210 | Rotation detecting apparatus and scale having a multi helix diffraction grating for the same | Koh Ishizuka, Satoshi Ishii, Kenji Hisamoto | 1996-07-16 |