YS

Yasuhiro Shimada

Canon: 80 patents #233 of 19,416Top 2%
Fujitsu Limited: 46 patents #330 of 24,456Top 2%
Sumitomo Electric Industries: 36 patents #330 of 21,551Top 2%
PA Panasonic: 17 patents #1,285 of 21,108Top 7%
FI Fujifilm Business Innovation: 8 patents #1,176 of 5,238Top 25%
SY Symetrix: 2 patents #35 of 73Top 50%
FU Fujifilm: 2 patents #2,431 of 4,519Top 55%
HA Hitachi Astemo: 1 patents #649 of 1,276Top 55%
SC Sumitomo Seika Chemicals Co.: 1 patents #180 of 365Top 50%
YC Yamashita Rubber Co.: 1 patents #28 of 102Top 30%
AC Asai Germanium Research Institute Co.: 1 patents #20 of 39Top 55%
KC Komatsu Electronic Metals Co.: 1 patents #82 of 160Top 55%
SC Seitetsu Kagaku Co.: 1 patents #38 of 86Top 45%
Overall (All Time): #3,444 of 4,157,543Top 1%
198
Patents All Time

Issued Patents All Time

Showing 126–150 of 198 patents

Patent #TitleCo-InventorsDate
6198225 Ferroelectric flat panel displays Gota Kano, Shinichiro Hayashi, Koji Arita, Carlos A. Paz de Araujo, Joseph D. Cuchiaro +1 more 2001-03-06
6171730 Exposure method and exposure apparatus Ryo Kuroda, Tsutomu Ikeda 2001-01-09
6169304 Semiconductor device having a passivation layer which minimizes diffusion of hydrogen into a dielectric layer Koji Arita, Eiji Fujii, Yasuhiro Uemoto, Toru Nasu, Akihiro Matsuda +4 more 2001-01-02
6163519 Scanning near-field optical microscope using the probe and recording and/or reproducing apparatus using the probe Ryo Kuroda 2000-12-19
6156215 Method of forming a projection having a micro-aperture, projection formed thereby, probe having such a projection and information processor comprising such a probe Takeo Yamazaki 2000-12-05
6126752 Semiconductor device having capacitor and manufacturing apparatus thereof Eiji Fujii, Yasuhiro Uemoto, Shinitirou Hayashi, Tooru Nasu, Koichi Arita +4 more 2000-10-03
6107657 Semiconductor device having capacitor and manufacturing method thereof Koji Arita, Eiji Fujii, Yasuhiro Uemoto, Toru Nasu, Akihiro Matsuda +4 more 2000-08-22
6107016 Silver halide color photographic lightsensitive material Takayuki Ito, Koji Takaku, Akira Ikeda, Hidetoshi Kobayashi 2000-08-22
6103460 Silver halide color photographic light-sensitive material Osamu Takahashi, Yasuhiro Yoshioka, Shin Soejima, Masakazu Morigaki 2000-08-15
6100100 Method for manufacturing capacitor element Yoshihisa Nagano, Eiji Fujii 2000-08-08
6080617 Semiconductor device having capacitor and manufacturing method thereof Eiji Fujii, Yasuhiro Uemoto, Shinitirou Hayashi, Tooru Nasu, Koichi Arita +4 more 2000-06-27
6068969 Silver halide color photographic light-sensitive material and method for forming an image using the same Hisashi Mikoshiba, Shin Soejima, Osamu Takahashi, Yasuaki Deguchi 2000-05-30
6046972 Method and producing probe with minute aperture, scanning near-field optical microscope using the probe and recording and/or reproducing apparatus using the probe Ryo Kuroda 2000-04-04
6045987 Silver halide color photographic light-sensitive material Hiroyuki Yoneyama 2000-04-04
6033920 Method of manufacturing a high dielectric constant capacitor Yasuhiro Uemoto, Atsuo Inoue, Taketoshi Matsuura, Masamichi Azuma 2000-03-07
6015987 Semiconductor device having capacitor exhibiting improved mositure resistance and manufacturing method thereof Koji Arita, Eiji Fujii, Yasuhiro Uemoto, Toru Nasu, Akihiro Matsuda +4 more 2000-01-18
6011261 Probe formed of mono-crystalline SI, the manufacturing method thereof, and an information processing device using the probe Tsutomu Ikeda, Takayuki Yagi, Takeo Yamazaki 2000-01-04
6001551 Silver halide color light-sensitive material Koushin Matsuoka, Hiroyuki Yoneyama 1999-12-14
5966787 Process for producing a probe-driving mechanism Masaru Nakayama, Yutaka Hirai, Takayuki Yagi, Yuji Kasanuki, Keisuke Yamamoto +1 more 1999-10-19
5959957 Probe and a cantilever formed with same material Tsutomu Ikeda, Takayuki Yagi 1999-09-28
5929475 Capacitor for integrated circuit and its fabrication method Yasuhiro Uemoto, Eigi Fujii, Koji Arita, Yoshihisa Nagano, Masamichi Azuma +2 more 1999-07-27
5923637 Method of manufacturing micro-tip for detecting tunneling current or micro-force or magnetic force Takayuki Yagi, Tsutomu Ikeda 1999-07-13
5920574 Method for accelerated test of semiconductor devices Keisaku Nakao, Atsuo Inoue, Masamichi Azuma, Eiji Fujii 1999-07-06
5897327 Method of evaluating a semiconductor wafer Eiichi Asano, Hisami Motoura 1999-04-27
5866021 Method of manufacturing micro-tip and female mold substrate therefor, and method of manufacturing probe with micro-tip and the probe Takayuki Yagi, Tsutomu Ikeda 1999-02-02