HT

Hidehito Takayama

Canon: 14 patents #4,747 of 19,416Top 25%
MC Mitsubishi Chemical: 1 patents #1,511 of 3,022Top 50%
MI Mitsubishi Kagaku Iatron: 1 patents #6 of 35Top 20%
Overall (All Time): #300,935 of 4,157,543Top 8%
16
Patents All Time

Issued Patents All Time

Showing 1–16 of 16 patents

Patent #TitleCo-InventorsDate
7703697 Liquid discharge apparatus and method for aligning needle-like substances Yuji Tsuruoka, Kazuo Iwata, Takashi Mori, Eiichi Motai 2010-04-27
7632463 Analysis apparatus and condenser Haruyo Saitou 2009-12-15
7357690 Method for aligning needle-like structures and alignment unit Yuji Tsuruoka, Kazuo Iwata, Kazuhiro Jindai, Eiichi Motai, Takashi Mori 2008-04-15
7204139 Analytical chip, analytical-chip unit, and analysis apparatus 2007-04-17
7065874 Method for making liquid ejection head Nobuhito Yamaguchi, Akihiro Mouri 2006-06-27
7014987 Manufacturing method of liquid jet head Akihiro Mouri, Nobuhito Yamaguchi, Toshihiro Fukasaka 2006-03-21
6993840 Manufacturing method of liquid jet head Akihiro Mouri, Nobuhito Yamaguchi 2006-02-07
6443548 Printing apparatus and method for printing using a plurality of inks having different densities Kazumasa Matsumoto 2002-09-03
6439683 Image processing method and apparatus and recording apparatus Kazumasa Matsumoto, Hidehiko Saito, Hirokazu Sada 2002-08-27
6164747 Recording apparatus and method of controlling same Masataka Yashima, Kenichi Suzuki, Keiji Ohkoda, Akihiro Mouri, Osamu Kanome +2 more 2000-12-26
5601983 Method for specimen measurement Matsuomi Nishimura, Kazumi Tanaka, Toshikazu Ohnishi, Takeshi Miyazaki 1997-02-11
5599502 Liquid moving apparatus and measuring apparatus utilizing the same Takeshi Miyazaki, Matsuomi Nishimura, Kazuo Isaka, Kazumi Tanaka, Toshikazu Ohnishi +1 more 1997-02-04
5495105 Method and apparatus for particle manipulation, and measuring apparatus utilizing the same Matsuomi Nishimura, Kazuo Isaka, Tadashi Okamoto, Kazumi Tanaka, Toshikazu Onishi +1 more 1996-02-27
5427959 Apparatus and method for measuring specimen Matsuomi Nishimura, Kazumi Tanaka, Takeshi Miyazaki, Toshikazu Ohnishi 1995-06-27
5380490 Apparatus for measuring a test specimen Hiroaki Hoshi, Matsuomi Nishimura, Kazumi Tanaka, Takeshi Miyazaki, Toshikazu Ohnishi 1995-01-10
5370842 Sample measuring device and sample measuring system Takeshi Miyazaki, Matsuomi Nishimura, Takayuki Yagi, Kazumi Tanaka, Toshikazu Ohnishi +3 more 1994-12-06