FI

Fumitoshi Ito

ST Sandisk Technologies: 17 patents #365 of 2,224Top 20%
Canon: 16 patents #4,160 of 19,416Top 25%
RT Renesas Technology: 5 patents #592 of 3,337Top 20%
KT Kabushiki Kaisha Toshiba: 1 patents #13,537 of 21,451Top 65%
RE Renesas Electronics: 1 patents #2,739 of 4,529Top 65%
📍 Yokkaichi, JP: #72 of 2,072 inventorsTop 4%
Overall (All Time): #82,882 of 4,157,543Top 2%
39
Patents All Time

Issued Patents All Time

Showing 26–39 of 39 patents

Patent #TitleCo-InventorsDate
7768826 Methods for partitioned erase and erase verification in non-volatile memory to compensate for capacitive coupling effects 2010-08-03
7730490 System with user access-control information having signature and flow setting information for controlling order of performance of functions 2010-06-01
7719052 Semiconductor device Yoshiyuki Kawashima, Takeshi Sakai, Yasushi Ishii, Yasuhiro Kanamaru, Takashi Hashimoto +3 more 2010-05-18
7705387 Non-volatile memory with local boosting control implant 2010-04-27
7639836 Image copying device and image processing system 2009-12-29
7535766 Systems for partitioned soft programming in non-volatile memory 2009-05-19
7499317 System for partitioned erase and erase verification in a non-volatile memory to compensate for capacitive coupling 2009-03-03
7499338 Partitioned soft programming in non-volatile memory 2009-03-03
7495954 Method for partitioned erase and erase verification to compensate for capacitive coupling effects in non-volatile memory 2009-02-24
7440326 Programming non-volatile memory with improved boosting 2008-10-21
7349250 Semiconductor device Yoshiyuki Kawashima, Takeshi Sakai, Yasushi Ishii, Yasuhiro Kanamaru, Takashi Hashimoto +3 more 2008-03-25
7087955 Semiconductor device and a method of manufacturing the same Yoshiyuki Kawashima, Takeshi Sakai, Yasushi Ishii, Yasuhiro Kanamaru, Takashi Hashimoto +2 more 2006-08-08
7067889 Method for manufacturing semiconductor integrated circuit device Tatsuya Hinoue, Shiro Kamohara 2006-06-27
6734114 Method for manufacturing semiconductor integrated circuit device Tatsuya Hinoue, Shiro Kamohara 2004-05-11