Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12020417 | Method and system for classifying defects in wafer using wafer-defect images, based on deep learning | Nir Dromi | 2024-06-25 |
| 9684960 | Automated histological diagnosis of bacterial infection using image analysis | Amir Handzel | 2017-06-20 |