Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12020417 | Method and system for classifying defects in wafer using wafer-defect images, based on deep learning | Isaac Daniel Buzaglo | 2024-06-25 |
| 11933695 | System and method for detecting anomalies in sensory data of industrial machines located within a predetermined proximity | David LAVID BEN LULU, Aleksandr TOLSTOV, Ilia Sergeevich Smyshliaev | 2024-03-19 |
| 11442444 | System and method for forecasting industrial machine failures | David LAVID BEN LULU | 2022-09-13 |
| 9708667 | MiRNA expression signature in the classification of thyroid tumors | Gila Lithwick Yanai, Eti Meiri, Yael Spector, Hila Benjamin | 2017-07-18 |
| 9096906 | Gene expression signature for classification of tissue of origin of tumor samples | Ranit Aharonov, Nitzan Rosenfeld, Shai Rosenwald | 2015-08-04 |