WV

Wielfried Vandervorst

CA Cameca: 1 patents #10 of 23Top 45%
IV Interuniversitair Micro-Electronica Centrum Vzw: 1 patents #167 of 450Top 40%
Overall (All Time): #3,899,170 of 4,157,543Top 95%
1
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Issued Patents All Time

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
4912325 Method for sample analysis by sputtering with a particle beam, and device to implement said method Bernard Rasser, Peter De Bisschop 1990-03-27