Issued Patents All Time
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 4801849 | Ion source operating by surface ionization in particular for providing an ion probe | Bernard Daigne, Francois Girard | 1989-01-31 |
| 4748325 | Method and device to discharge samples of insulating material during ion analysis | — | 1988-05-31 |
| 4694170 | Instrument for very high resolution ionic micro-analysis of a solid sample | Bernard Daigne, Francois Girard | 1987-09-15 |
| 4672204 | Mass spectrometers | Marcel Chaintreau, Roger Dennebouy, Jean-Claude Lorin | 1987-06-09 |
| 4638160 | High clarity mass spectrometer capable of multiple simultaneous detection | Francois Costa de Beauregard, Bernard Daigne, Francois Girard | 1987-01-20 |
| 4564758 | Process and device for the ionic analysis of an insulating sample | Marcel Chaintreau, Roger Dennebouy | 1986-01-14 |