Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 4779046 | Electron beam integrated circuit tester | Jean-Michel Rouberoi | 1988-10-18 |
| 4638160 | High clarity mass spectrometer capable of multiple simultaneous detection | Georges Slodzian, Bernard Daigne, Francois Girard | 1987-01-20 |