Issued Patents All Time
Showing 1–11 of 11 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12306092 | Imaging spectropolarimeter and sample characterization methodology utilizing the same | Mazen Zawaideh, Chris Claypool | 2025-05-20 |
| 11668645 | Spectroscopic ellipsometry system for thin film imaging | Chris Claypool | 2023-06-06 |
| 11499870 | Imaging spectropolarimeter | Mazen Zawaideh, Chris Claypool | 2022-11-15 |
| 8330959 | Multi-channel surface plasmon resonance instrument | Christopher L. Claypool | 2012-12-11 |
| 8319966 | Optical metrology systems and methods | Javier Ruiz | 2012-11-27 |
| 7505133 | Optical metrology systems and methods | Javier Ruiz | 2009-03-17 |
| 7463355 | Nondestructive optical technique for simultaneously measuring optical constants and thickness of thin films | — | 2008-12-09 |
| 6140832 | Method of utilizing IDDQ tests to screen out defective parts | Truc Q. Vu, Nhan Do, Glenn M. Kramer | 2000-10-31 |
| 5999267 | Nondestructive optical techniques for simultaneously measuring optical constants and thicknesses of single and multilayer films | — | 1999-12-07 |
| 5889592 | Nondestructive optical techniques for simultaneously measuring optical constants and thicknesses of single and multilayer films | — | 1999-03-30 |
| 5877557 | Low temperature aluminum nitride | — | 1999-03-02 |