Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11327287 | Microscope | David Anthoine | 2022-05-10 |
| 7937240 | Method and device for characterizing, using active pyrometry, a thin-layer material arranged on a substrate | Pierre-Yves Thro, Sergey Fomichev, Alexandre Semerok | 2011-05-03 |