Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7821655 | In-situ absolute measurement process and apparatus for film thickness, film removal rate, and removal endpoint prediction | Alan C. Janos | 2010-10-26 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7821655 | In-situ absolute measurement process and apparatus for film thickness, film removal rate, and removal endpoint prediction | Alan C. Janos | 2010-10-26 |