WG

Willem van Gelder

AT AT&T: 1 patents #10,626 of 18,772Top 60%
📍 Lehighton, PA: #57 of 101 inventorsTop 60%
🗺 Pennsylvania: #43,221 of 74,527 inventorsTop 60%
Overall (All Time): #4,036,040 of 4,157,543Top 100%
1
Patents All Time

Issued Patents All Time

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
4454001 Interferometric method and apparatus for measuring etch rate and fabricating devices Marek A. Sternheim 1984-06-12