Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 4454001 | Interferometric method and apparatus for measuring etch rate and fabricating devices | Marek A. Sternheim | 1984-06-12 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 4454001 | Interferometric method and apparatus for measuring etch rate and fabricating devices | Marek A. Sternheim | 1984-06-12 |