Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 4454001 | Interferometric method and apparatus for measuring etch rate and fabricating devices | Willem van Gelder | 1984-06-12 |
| 4441249 | Semiconductor integrated circuit capacitor | Joshua Alspector, Eliezer Kinsbron | 1984-04-10 |