Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5240866 | Method for characterizing failed circuits on semiconductor wafers | J. David Friedman, Mark Hansen, Vijayan Nair | 1993-08-31 |
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5240866 | Method for characterizing failed circuits on semiconductor wafers | J. David Friedman, Mark Hansen, Vijayan Nair | 1993-08-31 |