JF

J. David Friedman

AT AT&T: 1 patents #10,626 of 18,772Top 60%
Overall (All Time): #3,832,043 of 4,157,543Top 95%
1
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
5240866 Method for characterizing failed circuits on semiconductor wafers Mark Hansen, James HOYER, Vijayan Nair 1993-08-31