| RE49225 |
Structured low-density parity-check (LDPC) code |
Michael Livshitz, Aleksandar Purkovic, Nina Burns, Sergey Sukhobok |
2022-09-27 |
| RE48212 |
Structured low-density parity-check (LDPC) code |
Michael Livshitz, Aleksandar Purkovic, Nina Burns, Sergey Sukhobok |
2020-09-15 |
| 10461529 |
Trigger circuitry for electrostatic discharge (ESD) protection |
Nathaniel Peachey |
2019-10-29 |
| 9997509 |
Electrostatic discharge (ESD) protection circuit |
Nathaniel Peachey |
2018-06-12 |
| RE46692 |
Structured low-density parity-check (LDPC) code |
Michael Livshitz, Aleksandar Purkovic, Nina Burns, Sergey Sukhobok |
2018-01-30 |
| 8301975 |
Structured low-density parity-check (LDPC) code |
Michael Livshitz, Aleksandar Purkovic, Nina Burns, Sergey Sukhobok |
2012-10-30 |
| 8024641 |
Structured low-density parity-check (LDPC) code |
Michael Livshitz, Aleksandar Purkovic, Nina Burns, Sergey Sukhobok |
2011-09-20 |
| 7996746 |
Structured low-density parity-check (LDPC) code |
Michael Livshitz, Aleksandar Purkovic, Nina Burns, Sergey Sukhobok |
2011-08-09 |
| 7408812 |
Low-voltage single-layer polysilicon EEPROM memory cell |
Damian Carver |
2008-08-05 |
| 7256445 |
Fabrication of an EEPROM cell with emitter-polysilicon source/drain regions |
— |
2007-08-14 |
| 7208795 |
Low-cost, low-voltage single-layer polycrystalline EEPROM memory cell integration into BiCMOS technology |
Damian Carver |
2007-04-24 |
| 7144775 |
Low-voltage single-layer polysilicon eeprom memory cell |
Damian Carver |
2006-12-05 |
| 7091075 |
Fabrication of an EEPROM cell with SiGe source/drain regions |
— |
2006-08-15 |
| 6875648 |
Fabrication of an EEPROM cell with emitter-polysilicon source/drain regions |
— |
2005-04-05 |
