Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12250364 | Testing device and testing method for detecting stitching defect of panoramic camera | — | 2025-03-11 |
| 7423764 | Integrated interference scanning method | Yao-Min Lin, Huang-Chang Chang, Wei-Che Chang | 2008-09-09 |