NS

Nilay Saha

AB Asml Netherlands B.V.: 1 patents #2,025 of 3,192Top 65%
Overall (All Time): #3,142,082 of 4,157,543Top 80%
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Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
8345231 Method of determining defects in a substrate and apparatus for exposing a substrate in a lithographic process Hermen Folken Pen 2013-01-01