Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12164233 | Metrology method and apparatus for of determining a complex-valued field | Willem Marie Julia Marcel Coene, Nitesh Pandey | 2024-12-10 |
| 12117734 | Metrology method and device for determining a complex-valued field | Nitesh Pandey | 2024-10-15 |
| 10234384 | Inspection apparatus and method, lithographic apparatus, method of manufacturing devices and computer program | Willem Marie Julia Marcel Coene | 2019-03-19 |