Issued Patents All Time
Showing 26–50 of 62 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6804386 | Optical member inspecting apparatus and method of inspection thereof | Toshihiro Nakayama, Masato Hara, Atsushi Kida | 2004-10-12 |
| 6790694 | High frequency semiconductor module, high frequency semiconductor device and manufacturing method for the same | Toru Sugiyama, Kouhei Morizuka, Yasuhiko Kuriyama, Yoshikazu Tanabe | 2004-09-14 |
| 6788804 | Optical member inspecting apparatus and method of inspection thereof | Toshihiro Nakayama, Masato Hara, Atsushi Kida | 2004-09-07 |
| 6757974 | Fuel inlet and manufacturing method thereof | Tsuguo Kido, Tetsuji Omori, Keiichi Yamamoto, Yuji Nakada, Seiji Yamamoto +1 more | 2004-07-06 |
| 6724263 | High-frequency power amplifier | — | 2004-04-20 |
| 6697513 | Optical member inspecting apparatus and method of inspection thereof | Toshihiro Nakayama, Masato Hara, Atsushi Kida | 2004-02-24 |
| 6687396 | Optical member inspection apparatus, image-processing apparatus, image-processing method, and computer readable medium | Kiyoshi Yamamoto, Taichi Nakanishi | 2004-02-03 |
| 6669599 | Shift control apparatus for an automatic transmission | Masakatsu Iwase, Masamichi Unoki, Mitsunori Nakane, Kazuo Koumura, Muneo Kusafuka | 2003-12-30 |
| 6661290 | High-frequency power amplifier | — | 2003-12-09 |
| 6636625 | Optical member inspecting apparatus and method of inspection thereof | Toshihiro Nakayama, Masato Hara, Atsushi Kida | 2003-10-21 |
| 6535627 | Optical member inspecting apparatus and method of inspection thereof | Toshihiro Nakayama, Masato Hara, Atsushi Kida | 2003-03-18 |
| 6476909 | Optical member inspecting apparatus and method of inspection thereof | Toshihiro Nakayama, Masato Hara, Atsushi Kida | 2002-11-05 |
| 6477264 | Optical member inspecting apparatus and method of inspection thereof | Toshihiro Nakayama, Masato Hara, Atsushi Kida | 2002-11-05 |
| 6434263 | Optical member inspecting apparatus and method of inspection thereof | Toshihiro Nakayama, Masato Hara, Atsushi Kida | 2002-08-13 |
| 6430310 | Optical member inspecting apparatus and method of inspection thereof | Toshihiro Nakayama, Masato Hara, Atsushi Kida | 2002-08-06 |
| 6427023 | Optical member inspecting apparatus and method of inspection thereof | Toshihiro Nakayama, Masato Hara, Atsushi Kida | 2002-07-30 |
| 6390124 | Fuel inlet and manufacturing method thereof | Tsuguo Kido, Tetsuji Omori, Keiichi Yamamoto, Yuji Nakada, Seiji Yamamoto +1 more | 2002-05-21 |
| 6363165 | Optical member inspecting apparatus and method of inspection thereof | Toshihiro Nakayama, Masato Hara, Atsushi Kida | 2002-03-26 |
| 6351554 | Optical member inspecting apparatus and method of inspection thereof | Toshihiro Nakayama, Masato Hara, Atsushi Kida | 2002-02-26 |
| 6349145 | Optical member inspecting apparatus and method of inspection thereof | Toshihiro Nakayama, Masato Hara, Atsushi Kida | 2002-02-19 |
| 6314200 | Optical member inspecting apparatus and method of inspection thereof | Toshihiro Nakayama, Masato Hara, Atsushi Kida | 2001-11-06 |
| 6208475 | Optical-member inspection apparatus and holder for inspection target member | Kiyoshi Yamamoto, Taichi Nakanishi, Takashi Tohara, Masato Hara | 2001-03-27 |
| 6148097 | Optical member inspecting apparatus and method of inspection thereof | Toshihiro Nakayama, Masato Hara, Atsushi Kida | 2000-11-14 |
| 6127716 | Heterojunction bipolar transistor and manufacturing method thereof | Kouhei Morizuka | 2000-10-03 |
| 6072203 | Semiconductor device | Chiharu Nozaki, Minoru Amano, Yukie Nishikawa, Takao Noda, Aki Sasaki +1 more | 2000-06-06 |