Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12372881 | Deep learning based adaptive alignment precision metrology for digital overlay | Tamer Coskun, Aidyn Kemeldinov | 2025-07-29 |
| 10130252 | Trial frame and method for measuring key parameter thereof | Jen-Hui Chuang, Yi-Yu Hsieh | 2018-11-20 |