SM

Sukesh Mohan

Applied Materials: 1 patents #4,780 of 7,310Top 70%
Overall (All Time): #3,395,247 of 4,157,543Top 85%
1
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
7265382 Method and apparatus employing integrated metrology for improved dielectric etch efficiency Dimitris Lymberopoulos, Gary Hsueh 2007-09-04