Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12141230 | Process abnormality identification using measurement violation analysis | Selim Nahas, Joseph James Dox, Vishali Ragam, Eric J. Warren, Shijing Wang +2 more | 2024-11-12 |
| 11487848 | Process abnormality identification using measurement violation analysis | Selim Nahas, Joseph James Dox, Vishali Ragam, Eric J. Warren, Shijing Wang +2 more | 2022-11-01 |