Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12141230 | Process abnormality identification using measurement violation analysis | Selim Nahas, Vishali Ragam, Eric J. Warren, Shijing Wang, Charles Largo +2 more | 2024-11-12 |
| 11487848 | Process abnormality identification using measurement violation analysis | Selim Nahas, Vishali Ragam, Eric J. Warren, Shijing Wang, Charles Largo +2 more | 2022-11-01 |
| 9915940 | Bi-directional association and graphical acquisition of time-based equipment sensor data and material-based metrology statistical process control data | Brad A. Schulze | 2018-03-13 |