MJ

Matthew J. Jolley

Applied Materials: 3 patents #2,994 of 7,310Top 45%
ES Etec Systems: 3 patents #11 of 61Top 20%
AT Ateq: 2 patents #7 of 31Top 25%
Overall (All Time): #660,725 of 4,157,543Top 20%
8
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
6998217 Critical dimension edge placement and slope enhancement with central pixel dose addition and modulated inner pixels Jerry Martyniuk, H. Christopher Hamaker, Peter Pirogovsky, Asher Klatchko, Richard E. Crandall 2006-02-14
6819450 Enhanced edge resolution and critical dimension linearity in lithography Jerry Martyniuk, H. Christopher Hamaker 2004-11-16
6812474 Pattern generation method and apparatus using cached cells of hierarchical data Asher Klatchko, Robert Sills 2004-11-02
5959606 Rasterizer for pattern generator Allan L. Goodman, Morris H. Green, Robin L. Teitzel, John L. Wipfli 1999-09-28
5533170 Rasterizer for a pattern generation apparatus Robin L. Teitzel, James B. Campbell, Richard K. George, John L. Wipfli 1996-07-02
5386221 Laser pattern generation apparatus Paul C. Allen, Robin L. Teitzel, Michael L. Rieger, Michael Bohan, Timothy N. Thomas 1995-01-31
4879605 Rasterization system utilizing an overlay of bit-mapped low address resolution databases Paul Warkentin, Michael L. Rieger, Chris A. Michalski 1989-11-07
4806921 Rasterizer for pattern generator Allan L. Goodman, Morris H. Green, Robin L. Teitzel, John L. Wipfli 1989-02-21