Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6998217 | Critical dimension edge placement and slope enhancement with central pixel dose addition and modulated inner pixels | Jerry Martyniuk, Matthew J. Jolley, Peter Pirogovsky, Asher Klatchko, Richard E. Crandall | 2006-02-14 |
| 6819450 | Enhanced edge resolution and critical dimension linearity in lithography | Matthew J. Jolley, Jerry Martyniuk | 2004-11-16 |