Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8614790 | Optical system and method for inspection of patterned samples | Yoav Berlatzky, Ido Kofler, Doron Meshulach | 2013-12-24 |
KB
Kobi Barkan
Overall (All Time): #3,190,070 of 4,157,543Top 80%
1
Patents All Time