Issued Patents All Time
Showing 1–14 of 14 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11531138 | Processes and systems for correlating well logging data | Lin Liang, Tao Shan | 2022-12-20 |
| 11514935 | Magnetic read sensors having stabilized upper readers, and related methods | Xiaoyong Liu, Goncalo Marcos BAIÃO DE ALBUQUERQUE, Daniele Mauri, Yukimasa Okada | 2022-11-29 |
| 11430470 | Magnetic read sensors and related methods having a rear hard bias and no AFM layer | Xiaoyong Liu, Changhe Shang, Daniele Mauri, Yukimasa Okada | 2022-08-30 |
| 11170808 | Dual free layer reader head with magnetic seed layer decoupled from shield | Xiaoyong Liu, Goncalo Marcos BAIÃO DE ALBUQUERQUE, Daniele Mauri, Yukimasa Okada | 2021-11-09 |
| 11127422 | Magnetic read sensors and related methods having a rear hard bias and no AFM layer | Xiaoyong Liu, Changhe Shang, Daniele Mauri, Yukimasa Okada | 2021-09-21 |
| 10909024 | System and method for testing electronic visual user interface outputs | Benjamin Thomas Hare | 2021-02-02 |
| 7301619 | Evaluating a multi-layered structure for voids | Peter G. Borden | 2007-11-27 |
| 7141440 | Apparatus and method for measuring a property of a layer in a multilayered structure | Peter G. Borden | 2006-11-28 |
| 7088444 | Evaluating a multi-layered structure for voids | Peter G. Borden | 2006-08-08 |
| 7064822 | Evaluating a multi-layered structure for voids | Peter G. Borden | 2006-06-20 |
| 6971791 | Identifying defects in a conductive structure of a wafer, based on heat transfer therethrough | Peter G. Borden | 2005-12-06 |
| 6958814 | Apparatus and method for measuring a property of a layer in a multilayered structure | Peter G. Borden | 2005-10-25 |
| 6885444 | Evaluating a multi-layered structure for voids | Peter G. Borden | 2005-04-26 |
| 5415126 | Method of forming crystalline silicon carbide coatings at low temperatures | Mark Loboda, Andrew J. Steckl, Chong-Sheng Yuan | 1995-05-16 |