Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11860919 | System and method for generating and obtaining remote classification of condensed large-scale text objects | — | 2024-01-02 |
| 6649075 | Method and apparatus for measuring etch uniformity of a semiconductor wafer | Melisa Buie, Leonid Poslavsky | 2003-11-18 |