Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11107208 | Optical verification system and methods of verifying micro device transfer | Patrick J. Czarnota, Paul Argus Parks, Nile Alexander Light, Stephen P. Bathurst, John H. Higginson +3 more | 2021-08-31 |
| 10438339 | Optical verification system and methods of verifying micro device transfer | Patrick J. Czarnota, Paul Argus Parks, Nile Alexander Light, Stephen P. Bathurst, John H. Higginson +3 more | 2019-10-08 |
| 7738113 | Wafer measurement system and apparatus | David S. Marx, David L. Grant, Michael A. Mahoney | 2010-06-15 |