Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
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Andrew Davidson — 15 Patents

CMCascade Microtech: 4 patents #42 of 118Top 40%
Apple: 4 patents #6,401 of 18,612Top 35%
NFNew Focus: 3 patents #11 of 52Top 25%
BPBookham Technology, Plc: 1 patents #55 of 189Top 30%
NENewport: 1 patents #74 of 148Top 50%
Overall (All Time): #307,048 of 4,157,543Top 8%
15 Patents All Time
Andrew Davidson has been granted 15 US patents while listed as an inventor at Apple. The first was granted in 1989 and the most recent in December 2021. Andrew Davidson ranks #307,048 of 4,157,543 US inventors in our database (top 7.4%). Patent records list Andrew Davidson in Glasgow, OR, GB.

Issued Patents All Time

Showing 1–15 of 15 patents

Patent #TitleCo-InventorsDateApprox Value ⓘ
11195962 High responsivity high bandwidth photodiode and method of manufacture 2021-12-07
9280018 Multistable reflective liquid crystal device Nigel Mottram 2016-03-08
9193618 Glass alignment for high temperature processes Donald Ross, Adam Stagnaro, Matthew Theobald, Michael K. Pilliod 2015-11-24 $118,614,000
8892238 Edge break details and processing Edward T. Sweet, Roberto Flores Ortega, Simon Lancaster, Thomas Johannessen 2014-11-18
8549882 Pre-processing techniques to produce complex edges using a glass slumping process Michael K. Pilliod, Donald Ross 2013-10-08 $62,809,000
8526705 Driven scanning alignment for complex shapes Simon Lancaster 2013-09-03 $78,699,000
8336334 Glass alignment for high temperature processes Donald Ross, Adam Stagnaro, Matthew Theobald, Michael K. Pilliod 2012-12-25
7330657 Method to demultiplex wavelengths of light 2008-02-12 $914,000
7092644 Optical receiver including a dual gain path amplifier system 2006-08-15
6608847 Tunable laser with suppression of spontaneous emission Guangzhi Z. Zhang, David A. Robinson, Carter Hand, Mark Wippich, Murray Reed +1 more 2003-08-19 $1,964,000
6559946 Method and apparatus to minimize effects of ASE in optical measurements Jan-Willem Pieterse 2003-05-06 $1,820,000
5159262 Method for measuring the electrical and optical performance of on-wafer microwave devices Scott Rumbaugh 1992-10-27
5047725 Verification and correction method for an error model for a measurement network Eric W. Strid 1991-09-10
4905308 Noise parameter determination method 1990-02-27
4864218 Method of compensating for frequency errors in noise power meters Bernard W. Leake 1989-09-05