Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7568141 | Method and apparatus for testing embedded cores | Sankaran M. Menon, Tien Dinh, Thomas Tomazin, Juan Guillermo Revilla | 2009-07-28 |
| 7313739 | Method and apparatus for testing embedded cores | Sankaran M. Menon, Tien Dinh, Thomas Tomazin, Juan Guillermo Revilla | 2007-12-25 |
| 6959256 | Universally accessible fully programmable memory built-in self-test (MBIST) system and method | — | 2005-10-25 |
| 6675364 | Insertion of scan hardware | Mark T. Fox | 2004-01-06 |
| 6348825 | High performance, low power, scannable flip-flop | Dwight Elmer Galbi | 2002-02-19 |
| 6341361 | Graphical user interface for testability operation | W. David Dougherty | 2002-01-22 |