XZ

Xuejun Zhao

AM AMD: 1 patents #5,683 of 9,279Top 65%
Overall (All Time): #3,383,302 of 4,157,543Top 85%
1
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
7205165 Method for determining the reliability of dielectric layers Akram A. Salman, Kurt Taylor, Stephen G. Beebe 2007-04-17