Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12099091 | Cost-saving scheme for scan testing of 3D stack die | Qi Shao, Lifeng Zhang, Ahmet Tokuz, Lu Lu | 2024-09-24 |
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12099091 | Cost-saving scheme for scan testing of 3D stack die | Qi Shao, Lifeng Zhang, Ahmet Tokuz, Lu Lu | 2024-09-24 |