Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12216162 | Performing scan data transfer inside multi-die package with serdes functionality | Saurabh Upadhyay | 2025-02-04 |
| 12099091 | Cost-saving scheme for scan testing of 3D stack die | Songgan Zang, Qi Shao, Lifeng Zhang, Lu Lu | 2024-09-24 |
| 11762017 | Performing scan data transfer inside multi-die package with SERDES functionality | Saurabh Upadhyay | 2023-09-19 |
| 11181579 | Performing scan data transfer inside multi-die package with SERDES functionality | Saurabh Upadhyay | 2021-11-23 |
| 8707117 | Methods and apparatus to test multi clock domain data paths with a shared capture clock signal | Ari Shtulman, Karen Tucker | 2014-04-22 |