SD

S. Gabriel R. Dosdos

AM AMD: 1 patents #5,683 of 9,279Top 65%
📍 San Jose, CA: #22,480 of 32,062 inventorsTop 75%
🗺 California: #247,236 of 386,348 inventorsTop 65%
Overall (All Time): #3,554,018 of 4,157,543Top 90%
1
Patents All Time

Issued Patents All Time

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
6433360 Structure and method of testing failed or returned die to determine failure location and type Joel J. Orona, Daniel C. Nuez 2002-08-13