DN

Daniel C. Nuez

AM AMD: 2 patents #3,994 of 9,279Top 45%
📍 San Jose, CA: #17,604 of 32,062 inventorsTop 55%
🗺 California: #185,134 of 386,348 inventorsTop 50%
Overall (All Time): #2,193,249 of 4,157,543Top 55%
2
Patents All Time

Issued Patents All Time

Showing 1–2 of 2 patents

Patent #TitleCo-InventorsDate
6768329 Structure and method of testing failed or returned die to determine failure location and type S. Gabriel R. Dosdos, Joel J. Orona 2004-07-27
6433360 Structure and method of testing failed or returned die to determine failure location and type S. Gabriel R. Dosdos, Joel J. Orona 2002-08-13