Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8122413 | Transparent test method and scan flip-flop | Steven C. Eplett, Rabi Sengupta, Eric T. West, Lyle B. Smith | 2012-02-21 |
| 7840927 | Mutable cells for use in integrated circuits | Harold W. Dozier, Steven C. Eplett | 2010-11-23 |
| 6079040 | Module level scan testing | T. Dean Skelton | 2000-06-20 |
| 4967351 | Central processor architecture implementing deterministic early condition code analysis using digit based, subterm computation and selective subterm combination | Allan J. Zmyslowski | 1990-10-30 |