Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6320402 | Parallel inspection of semiconductor wafers by a plurality of different inspection stations to maximize throughput | Khoi A. Phan, Bernard Matt | 2001-11-20 |
| 6087275 | Reduction of n-channel parasitic transistor leakage by using low power/low pressure phosphosilicate glass | Minh Van Ngo, Sunil Mehta | 2000-07-11 |