Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5561367 | Structure and method for testing wiring segments in an integrated circuit device | Roger David Carpenter, Vincent L. Tong | 1996-10-01 |
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5561367 | Structure and method for testing wiring segments in an integrated circuit device | Roger David Carpenter, Vincent L. Tong | 1996-10-01 |