Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12223641 | Defect detection of a semiconductor specimen | Boaz Dudovich, Assaf Ariel, Amir Bar, Lior Yehieli, Chen Itzikowitz +3 more | 2025-02-11 |
| 9646350 | System, method, and computer program for performing operations on network files including captured billing event information | Amit Agarwal, Yael Cohen, Sanjay Bhatia | 2017-05-09 |