Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8904252 | Scan test circuit with scan clock | Kin-Hooi Dia, Joseph Patrick Geisler | 2014-12-02 |
| 7652524 | Voltage source for gate oxide protection | Ravinder Reddy Rachala, Shawn Searles, Lena Ahlen, Matthew Cooke | 2010-01-26 |
| 7242219 | Circuit for parity tree structure | Eric W. Mahurin | 2007-07-10 |