Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11567130 | Input/output voltage testing with boundary scan bypass | Alon Postavski, Etai Wagner, Victor Romanov | 2023-01-31 |
| 10990739 | Scan channel fabric for tiled circuit designs | Sergey Kleyman, Danny Sapoznikov | 2021-04-27 |
| 10955472 | Yield-oriented design-for-test in power-switchable cores | Valentin Bader, Shlomi Vilozny, Shimon Rahamim, Danny Sapoznikov, Yair Armoza +1 more | 2021-03-23 |
| 10187044 | Bistable-element for random number generation | Ron Diamant, Elad Valfer, Yair Armoza | 2019-01-22 |
| 9983262 | Built-in self test controller for a random number generator core | Ron Diamant | 2018-05-29 |
| 9774317 | Bistable-element for random number generation | Ron Diamant, Elad Valfer, Yair Armoza | 2017-09-26 |