WW

Wilhelm Warta

AF Albert-Ludwigs-Universitaet Freiburg: 1 patents #93 of 368Top 30%
CK Christian-Albrechts-Universitaet Zu Kiel: 1 patents #24 of 101Top 25%
Fraunhofer: 1 patents #1,798 of 4,748Top 40%
Overall (All Time): #3,124,660 of 4,157,543Top 80%
1
Patents All Time

Issued Patents All Time

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
8829938 Measuring method and device for characterizing a semiconductor component Jürgen Carstensen, Andreas Schütt, Helmut Foll, Martin Kasemann 2014-09-09